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Component Test

A combination of two or more interrelated equipment (sets) arranged in a functional package to perform testing of particular components. (atis.org)


Showing results: 766 - 780 of 866 items found.

  • Edge Press Technology Bed of Nails Testers

    Protector Edge Press Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Insulation Testers

    JP3X Series - Danbridge a/s

    The Danbridge non-destructive High Voltage Insulation Testers meet the demands for a gentle method of testing insulation condition and detecting leakage currents while protecting hardware, components and materials. Danbridge have two High Voltage Insulation Testers depending on requirements - JP30A can test using up to 30k volt, while JP36A is used when voltages up to 36k volt are desired.

  • Multifunction Instrument for Education and Training

    LabXplorer - DesignSoft, Inc.

    LabXplorer turns your desktop, laptop, tablet or smart phone into a powerful, multifunction test and measurement instrument for a wide range of applications. Instruments, whatever you need, are at your fingertips. LabXplorer provides multimeter, oscilloscope, spectrum analyzer, logic analyzer, programmable analog and digital signal generator, impedance analyzer and also measures characteristics of passive electronic components and semiconductor devices.

  • Electromagnetic Resonance High Frequency Fatigue Testing Machine

    PLG Series - Jinan Testing Equipment IE Corporation

    The series of electromagnetic resonance fatigue testing machines are used for fatigue tests of metal materials and components under tension, compression or reversal loads. If relevant grips are provided, three-point bending test, four-point and circle test, gear wheat, bolt, connecting rod, roller chain, crackle expanding test can be available. The series of electromagnetic resonance fatigue testing machines feature an optimized design and a rational structure. The automatic controlled system adopts an advanced and wide-pulse-control system and a new-type of power amplifier to improve the reliability of the electric system. The electromagnetic resonance fatigue testing system is with high efficiency, easy and non-stop shake, low energy consuming, accurate control, and small fluctuation.

  • Launch Analyzer

    2440 - Photon Kinetics

    The 2440 Launch Analyzer is the first fully automated test system for characterizing the optical power distribution of the light produced by VCSEL laser sources, multimode fiber test equipment and launch cords utilized in multimode fiber links. Built on over 20 years of experience testing the transmission and geometric properties of muitimode fibers, the 2440 is the ideal solution for ensuring that source launches comply with applicable international component specifications and measurement standards. The 2440 can be configured for measurements in either or both the 850 and 1300 nm windows.

  • MPI Fully Automatic Probe Systems

    MPI Advanced Semiconductor Test

    Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test  (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.

  • Thermal Shock Environmental Test Chamber

    Guangdong Bell Experiment Equipment Co.,Ltd

    DGBell’s Thermal Shock Chamber provide the sudden temperature changes between extreme cold and extreme hot from -65℃ to 150℃ (customized available), specially for environmental stress screen test of the industries that rely on thermal testing, such as component, board electronic assemblies, defense, material stress, consumer products etc.  The thermal shock test can cause faulting or cracking by the expansion and contraction on the products, indicates the hidden manufacturing defects. Bell’s Thermal Shock Chamber ensure you to launch qualified product to the market.

  • Universal Test System

    LEON System - Konrad Technologies GmbH

    A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.

  • Walk-In Temperature & Humidity Test Chamber

    ACMAS Technologies Pvt. Ltd.

    Weiber walk in humidity test chambers are conceptualized and designed to create test chambers to study and contemplate the effects of different environmental parameters such as humidity, temperature applications tests involving micro-organisms, plants, tissues, electronic components etc. apart from various customized industrial and research applications. Our humidity test chambers have a variety of usage in R and D laboratories, research studies and product testing facilities across the globe. Apart from that, these chambers have a variety of usages in tissue culture applications, enzyme reaction studies, growth observation studies, fermentation analysis and various other general and specialized applications in various laboratories. We specialize in both standard and customized humidity test cabinets, specifically designed to meet the challenging demands of various scientists for individual and specialized research applications.

  • Board Stress Analysis

    Arcadia Test

    Board stress analysis is an increasingly critical part of the test fixture build process today. Probe densities under BGA devices put tremendous pressure onto the solder joints of these devices. If the fixture is not designed properly, immediate damage can occur to the BGA’s, or even more devastating, future damage, which creates field failures. We can provide strain testing before shipping your fixture to insure that there are not excessive forces placed on your BGA parts. With the use of National Instruments Strain equipment, and tri-directional rosettes, we cycle test the board/fixture and measure and record the amount of strain from each corner of each BGA. Any over limit conditions are corrected before shipment. This service insures that your products will not be damaged at ICT, and help to reduce field failures from damaged components, compromised solder joints, or lifted pads.

  • Combined Environmental Reliability Test System

    VTC SERIES - EMIC Corporation

    HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid thermal change rates required to achieve maximum product stress. Additionally, these rates are accomplished with smaller space requirements, lower audible noise, no water requirement, and lower maintenance costs than a typical refrigeration system.

  • Full Band Down-Converters

    STC-20-10-S1 - ERAVANT

    Full band down-converters are designed to convert high frequency millimeterwave signals down to the baseband at 10 MHz to 1.6 GHz. These down-converters deliver a superior performance since they are assembled with SAGE Millimeter’s instrumentation grade components, such as multipliers, amplifiers, filters, isolators, and more. The below standard offering covers the frequency range of 26.5 to 170 GHz and delivers a typical LO power of 3 dBm and conversion gain of 20 dB. The down-converters provide low harmonic levels and excellent gain flatness, making them ideal for test instrumentation applications. Specifications other than those listed below are available upon request.

  • Electronic Ballast Tester

    WT4000 - Lisun Electronics Inc.

    • Measure parameter: 1) Input: Vrms, Lrms, W, PF, Hz, Phasic angle, total harmonic and 0-39 component of harmonic. 2) Output: Lamp voltage, Lamp current, Filament current, Guided cathodic current, Lamp power, crest factor and oscillatory frequency, single high frequency analysis. • Startup: Startup lamp voltage, lamp current, filament current, guided cathodic current curve and parameter, preheating time; • Simultaneously display on 8 windows for input and output parameters, convenient for comparison and analysis; • Test preheat energy, filament preheat time. And the parameters changes from 0 to 5s of filament voltage, filament current and filament power; • Up to 1MHz lrms test content to every EB; • Analysis symmetry of high Frequency curve of lout; • 12-bit high-speed A/D, sampling rate up to 10MHz, can easily analyse signal curve of output; • Finish an input and output testing at the same time within 1 minute; • Portable, can test, display, print without computer. Test report include data and curve, comply with international standard; • Communication port for PC, run under Windows98 or Windows2000, English Version available.

  • Colorimetry, Turbidity & UV-Vis Spectrophotometry

    Thermo Fisher Scientific Inc.

    Colorimetry, turbidity, and spectrophotometry meters for water analysis. You can choose from 134 preprogrammed methods to measure the concentrations of sample components with our colorimetry meters. These portable meters can go with you anywhere to test drinking water or wastewater. Take your portable turbidity meter to the source for on-site measuring. Our turbidity meters feature white and infrared light sources allowing you to meet regulatory methods. Achieve simple and efficient water and wastewater analysis with our UV-Vis and Vis spectrophotometers. These meters include over 260 preprogrammed methods using common reagent chemistries, making them the ideal instruments to include in your laboratory.

  • Resistors

    Vishay Intertechnology, Inc.

    A passive two-terminal electrical component that implements electrical resistance as a circuit element. In electronic circuits, resistors are used to reduce current flow, adjust signal levels, to divide voltages, bias active elements, and terminate transmission lines, among other uses. High-power resistors that can dissipate many watts of electrical power as heat may be used as part of motor controls, in power distribution systems, or as test loads for generators. Fixed resistors have resistances that only change slightly with temperature, time or operating voltage. Variable resistors can be used to adjust circuit elements (such as a volume control or a lamp dimmer), or as sensing devices for heat, light, humidity, force, or chemical activity.

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